Online BIST for embedded systems

H. Al-Asaad, B.T. Murray, J.P. Hayes
<span title="">1998</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="" style="color: black;">IEEE Design &amp; Test of Computers</a> </i> &nbsp;
Embedded systems must meet increasingly high expectations of safety and high reliability. The authors survey onlinetesting techniques for identifying faults that can lead to system failure. They focus on online built-in self-test and its role in a comprehensive testing approach. . Hussain Al-Asaad is an assistant professor in the department of Electrical and Computer Engineering at the University of California, Davis. His research interests include design verification, testing, and
more &raquo; ... t computing. Al-Asaad received his BE in computer and communications engineering from the American University of Beirut, Lebanon, his MS in computer engineering from Northeastern University, Boston, and his PhD in computer science and engineering from the University of Michigan, Ann Arbor. He is a member of the IEEE, ACM, and Sigma Xi. Brian T. Murray is a member of the technical staff of General Motors Global Research and Development Operations, where he has led projects in testing, high-dependability embedded systems, and computer architecture. He is also an adjunct lecturer at the University of Michigan. Murray received the AB in physics and mathematics from Albion College, the MS in electrical engineering from Duke University, and the PhD in computer science and engineering from the University of Michigan. He is a member of the IEEE, ACM, Sigma Xi, and Phi Beta Kappa. John P. Hayes is a professor in the Electrical Engineering and Computer Science Department at the University of Michigan, Ann Arbor. He teaches and conducts research in computer-aided design verification and testing, computer architecture, VLSI design, and fault-tolerant computing. Hayes received the BE from the National University of Ireland, Dublin, and the MS and PhD from the University of Illinois, all in electrical engineering. He is an IEEE fellow and a member of ACM and Sigma Xi. Send questions and comments about this article to Hussain Al-Asaad, University of California, Davis,
<span class="external-identifiers"> <a target="_blank" rel="external noopener noreferrer" href="">doi:10.1109/54.735923</a> <a target="_blank" rel="external noopener" href="">fatcat:j7xkxctuajdqhnxwhaev7r6ycy</a> </span>
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