Fast normalized cross correlation for defect detection

Du-Ming Tsai, Chien-Ta Lin
2003 Pattern Recognition Letters  
Normalized cross correlation has been used extensively for many machine vision applications, but the traditional normalized correlation operation does not meet speed requirements for time-critical applications. In this paper, we propose a fast normalized cross correlation computation for defect detection application. A
doi:10.1016/s0167-8655(03)00106-5 fatcat:5jjdydd7mncbvld2s26b3ucofm