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Enhancing Nutt-Based Time-to-Digital Converter Performance with Internal Systematic Averaging
IEEE Transactions on Instrumentation and Measurement
A time-to-digital converter (TDC) often consists of sophisticated, multilevel, subgate delay structures, when time intervals need to be measured precisely. The resolution improvement is rewarding until integral nonlinearity (INL) and random jitter begins to limit the measurement performance. INL can then be minimized with calibration techniques and result postprocessing. The TDC architecture based on a counter and timing signal interpolation (the Nutt method) makes it possible to measure longdoi:10.1109/tim.2019.2932156 fatcat:h2zk4emq6bhs3lducuwm6bv654