Detecting and Analyzing Nonlinearity-caused Oscillations in Process Control Systems Using an Improved VNCMD

Louying Fan, Weihua Shen, Ganfei Lou, Wenyan Ci
<span title="">2021</span> <i title="Institute of Electrical and Electronics Engineers (IEEE)"> <a target="_blank" rel="noopener" href="https://fatcat.wiki/container/q7qi7j4ckfac7ehf3mjbso4hne" style="color: black;">IEEE Access</a> </i> &nbsp;
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