Determination of parameters of cadmium telluride films on silicon by the methods of main angle and multiangular ellipsometry

V.A. Odarych, Taras Shevchenko Kyiv National University, Physics Department, 2, prospect Academician Glushkov, 03022 Kyiv, Ukraine, e-mail: wladodarych@narod.ru
2006 Semiconductor Physics, Quantum Electronics & Optoelectronics  
doi:10.15407/spqeo9.01.055 fatcat:juidll5klfgtpb7gv4gw4iobsi