New interferometric method for the complete determination of the properties of the light field scattered by a rough surface

Michel Lequime, Nathalie Destouches, Hugues Giovannini, Claude Amra, H. Angus Macleod
1999 Advances in Optical Interference Coatings  
Total Integrated Scattering (TIS) and Bi-directional Reflectance Distribution Function (BRDF) measurements give information on the mean roughness of the surface and on the modulus of the Fourier Transform of the 2D surface profile. To obtain a more precise description of a rough surface and to get an estimation of the relative contribution of surface and volume scattering in multilayers stack, we have developed a new interferometric method which allows us to measure the variation of the phase
more » ... tion of the phase of the Fourier Transform of the surface profile as a function of the scattering angle. This paper includes a detailed presentation of this method, a description of the experimental set-up used for its principle validation, as well as some preliminary results that we have obtained with it on high reflectance samples.
doi:10.1117/12.360104 fatcat:ibwz4p5gonbl3da22nnm3u2duq