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Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature interactions (T -wise). T -wise dramatically reduces the number of test products while ensuring reasonable SPL coverage. However, automaticdoi:10.1109/icst.2010.43 dblp:conf/icst/PerrouinSKBT10 fatcat:3newifomynhkfkjxual6kxante