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Structural, optical and nanomechanical properties of (1 1 1) oriented nanocrystalline ZnTe thin films
2010
European Physical Journal : Applied physics
Structural, optical and nanomechanical properties of nanocrystalline Zinc Telluride (ZnTe) films of thickness upto 10 microns deposited at room temperature on borosilicate glass substrates are reported. X-ray diffraction patterns reveal that the films were preferentially oriented along the (1 1 1) direction. The maximum refractive index of the films was 2.74 at a wavelength of 2000 nm. The optical band gap showed strong thickness dependence. The average film hardness and Young's modulus
doi:10.1051/epjap/2010071
fatcat:7zqc3ievpzh6hlpaxkzb3tpzsu