Comparison of open and resistive-open defect test conditions in SRAM address decoders

Dilillo, Girard, Pravossoudovitch, Virazel, Borri
2003 Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03  
This paper presents a comparative analysis of open (ADOF: Address Decoder Open Fault) and resistive open defects in address decoders of embedded-SRAMs. Such defects are the primary target of this study because they are notoriously hard-to-detect faults. In particular, we consider dynamic defects which may appear in the transistor parallel plane of address decoders. From this study, we show that test conditions required for ADOFs testing (sensitization and observation) can be partially used also
more » ... partially used also for resistive open defect testing.
doi:10.1109/ats.2003.1250818 dblp:conf/ats/DililloGPVB03 fatcat:gernl54ikzcxljdfrmhqmj5zv4