R. M. A. Azzam, "Simulation of mechanical rotation by optical rotation: Application to the design of a new Fourier photopolarimeter," J. Opt. Soc. Am. 68, 518-521 (1978) sian Jones matrix with elements T1 2 = T21 = 0, T,1 = tanIeiA, and T 22 = 1. (' and A are the usual ellipsometric parameters.) If we substitute these elements in Eqs. (A2), and assume linearly polarized incident light so that Xi = tanOi, we obtain from Eq. (Al) the following ARF: 2 tanOi tan/i cosA tan 2 ' -tan 2 Oi which

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... with Eq. (3) of Ref. 1, as expected. If, in the above example, we try to determine the ARF by first finding the equivalent circular Jones matrix and then using any of the expressions of the ARF in Secs. II or III, we discover that this procedure is indeed considerably more complicated. Noted added in proof. A recent article' 4 provides a significant additional reference for this paper. 'J. Monin and G.-A. Boutry, "Conception, realisation et fonctionnement d'un nouvel ellipsombtre, " Nouv. Rev. Opt. 4, 159-169 (1973); and Refs. (19) and (20) listed therein. 2S. C. Som and C. Chowdhury, "New ellipsometric method for the determination of the optical constants of thin films and surfaces," J. Opt. Soc. Am. 62, 10-15 (1972). 3 Such an extension is a special case of generalized ellipsometry (see, e.g., R. M. A. Azzam and N. M. Bashara, "Applications of generalized ellipsometry to anisotropic crystals," J. Opt. Soc. Am. 64, 128-133 (1974)). 4For definiteness, we assume that 0, and 00 are measured from the plane of the incident and outgoing beams. 5 R. M. A.