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An increasing part of microelectronic systems is implemented on the basis of predesigned and preverified modules, so-called cores, which are reused in many instances. Core-providers offer RISC-kernels, embedded memories, DSPs, and many other functions, and built-in self-test is the appropriate method for testing complex systems composed of different cores. In this paper, we overview BIST methods for different types of cores and present advanced BIST solutions. Special emphasis is put ondoi:10.1016/s0167-9260(98)00021-2 fatcat:qenkm6odojampcjqguhbco6l6m