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Proceedings. 42nd Design Automation Conference, 2005.
Scan-based Design-for-Test (DFT) is a powerful testing scheme, but it can be used to retrieve the secrets stored in a crypto chip thus compromising its security. On one hand, sacrificing security for testability by using traditional scan-based DFT restricts its use in privacy sensitive applications. On the other hand, sacrificing testability for security by abandoning scan-based DFT hurts product quality. The security of a crypto chip comes from the small secret key stored in a few registersdoi:10.1109/dac.2005.193787 fatcat:rxs6mccfbrg3jbhuz3gobuawje