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The performance of a fast fault simulation algorithm for combinational circuits, such as the critical path tracing method, is determined primarily by the efficiency with which it can deduce the detectability of stem faults (stem analysis). We propose a graph based approach to perform stem analysis. A dynamic data structure, called the criticality constraint graph, is used during the backward pass to carry information related to self masking and multiple-path sensitization of stem faults. Thedoi:10.1109/iccad.1988.122486 dblp:conf/iccad/KeSB88 fatcat:pzy7sd3pmvbp3l5x4dogfq4amy