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International Journal of Research and Applications
Transparent BIST schemes for RAM modules assure the preservation of the memory contents during periodic testing Symmetric Transparent Built-in Self Test (BIST) schemes skip the signature prediction phase required in traditional transparent BIST. Achieving considerable reduction in test time. Previous works or symmetric transparent BIST schemes require that a separate BIST module is utilized for each RAM under test. This approach, giver the large number of memories available in current chips,doi:10.17812/ijra.1.4(28)2014 fatcat:me3l5udc3zeethogqabfhk3hmm