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Modeling and Inference for Measured Crystal Orientations and a Tractable Class of Symmetric Distributions for Rotations in Three Dimensions
Journal of the American Statistical Association
Electron Backscatter Diffraction (EBSD) is a technique used in materials science to study the microtexture of metals, producing data which measure orientations of crystals in a specimen. We examine the precision of such data based on a useful class of distributions on orientations in 3 dimensions (as represented by 3 × 3 orthogonal matrices with positive determinant). While such modeling has received attention in the statistical literature, the approach taken has typically been from generaldoi:10.1198/jasa.2009.ap08741 fatcat:amckd64vzrbuxa3cyadsv4wlgy