THE INVESTIGATION OF THE INFLUENCE OF X-RAY IRRADIATION AND WEAK MAGNETIC FIELD ON THE PARAMETERS STABILITY OF TRANSISTOR TEMPERATURE SENSORS

Б. В. Павлик, А. М. Леновенко, А. С. Грипа
2013 Sensor Electronics and Microsystem Technologies  
doi:10.18524/1815-7459.2013.2.109608 fatcat:nb7ng4rxirgbzhznqlao2tt63u