BIST-based delay-fault testing in FPGAs

M. Abramovici, C. Stroud
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)  
We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is comprehensive, and does not require expensive external test equipment (ATE). We have successfully implemented this BIST approach for delay-fault testing on the Lattice ORCA 2C and Xilinx Spartan FPGAs.
doi:10.1109/olt.2002.1030195 dblp:conf/iolts/AbramoviciS02 fatcat:lrwnj73vz5e6xnjut5aiv2vsfa