Dynamic Compaction in SAT-Based ATPG

Alexander Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
2009 2009 Asian Test Symposium  
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compaction procedure for SAT-based ATPG which utilizes internal data structures of the SAT solver to extract essential fault detection conditions and to generate patterns which cover multiple faults. We complement this technique by a state-of-the-art forward-looking reverse-order simulation procedure. Experimental results
more » ... tained for an industrial benchmark circuit suite show that the new method outperforms earlier static approaches by approximately 23%.
doi:10.1109/ats.2009.31 dblp:conf/ats/CzutroPERB09 fatcat:ntl3vnb62bh7lp2xqf5eminp3i