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TEXEMS: Texture Exemplars for Defect Detection on Random Textured Surfaces
2007
IEEE Transactions on Pattern Analysis and Machine Intelligence
We present an approach to detecting and localizing defects in random color textures which requires only a few defect free samples for unsupervised training. It is assumed that each image is generated by a superposition of various-size image patches with added variations at each pixel position. These image patches and their corresponding variances are referred to here as textural exemplars or texems. Mixture models are applied to obtain the texems using multiscale analysis to reduce the
doi:10.1109/tpami.2007.1038
pmid:17568147
fatcat:zaycrl2hjrhyrpzmyxlejok3mu