Evidence of a Larger EM-Induced Fault Model [chapter]

S. Ordas, L. Guillaume-Sage, K. Tobich, J.-M. Dutertre, P. Maurine
2015 Lecture Notes in Computer Science  
Electromagnetic waves have been recently pointed out as a medium for fault injection within circuits featuring cryptographic modules. Indeed, it has been experimentally demonstrated by A. Dehbaoui et al. [3] that an electromagnetic pulse, produced with a high voltage pulse generator and a probe similar to that used to perform EM analyses, was susceptible to create faults exploitable from a cryptanalysis viewpoint. An analysis of the induced faults [4] revealed that they originated from timing
more » ... nstraint violations. This paper experimentally demonstrates that EM injection, performed with enhanced probes is very local and can produce not only timing faults but also bit-set and bit-reset faults. This result clearly extends the range of the threats associated with EM fault injection. Smart Card Research and Advanced Applications. CARDIS 2014 http://dx.
doi:10.1007/978-3-319-16763-3_15 fatcat:wkg2xwibozhn5a4o7aku5tbsf4