Automatic Inspection of Foreign Particles on Patterned Sample by Means of Polarized Laser
偏光レーザーによるパターン付試料上の異物検査の自動化

Nobuyuki AKIYAMA, Yoshimasa OSHIMA, Mitsuyoshi KOIZUMI, Masakuni AKIBA, Hiroto NAGATOMO
1981 Transactions of the Society of Instrument and Control Engineers  
doi:10.9746/sicetr1965.17.237 fatcat:lcfc7xfyo5hx5ky6mcrddiuuwe