Statistically Validating the Impact of Process Variations on Analog and Mixed Signal Designs

Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar
2015 Proceedings of the 25th edition on Great Lakes Symposium on VLSI - GLSVLSI '15  
Process variation presents a practical challenge on the performance of analog and mixed signal (AMS) circuits. This paper proposes a Monte Carlo-Jackknife (MC-JK) technique, a variant of Monte Carlo method, to verify process variation affecting the performance and functionality of AMS designs. We use a behavioral model to which we encompass device variation due to 65nm technology process. Next, we conduct hypothesis testing based on the MC-JK technique combined with Latin hypercube sampling in
more » ... statistical run-time verification environment. Experimental results demonstrate the robustness of our approach in verifying AMS circuits.
doi:10.1145/2742060.2742122 dblp:conf/glvlsi/SeghaierZT15 fatcat:omvqbrm4gzg5leloxpnbwpjyrq