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High quality atpg for delay defects
International Test Conference, 2003. Proceedings. ITC 2003.
The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay defects and high transition fault coverage to capture gross delay defects. Furthermore, non-robust paths for ATPG are filtered (selected) carefully so that there is a minimum overlap with the already tested robust paths. A relationship between path delay fault model and transition fault model has been observed which helpsdoi:10.1109/test.2003.1270885 dblp:conf/itc/GuptaH03 fatcat:426wimlwzjeyvaqx6iymghcmx4