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Analog Circuit Fault Diagnosis Method Based on Preferred Wavelet Packet and ELM
2017
Proceedings of the 2017 2nd International Conference on Electrical, Automation and Mechanical Engineering (EAME 2017)
unpublished
In order to improve the effectiveness of fault feature extraction and achieve the accurate classification of fault patterns in analog circuit, the paper proposed a new analog circuit fault diagnosis method based on preferred wavelet packet and extreme learning machine (ELM). The concept of feature departure degree is defined, which can be used as a measure of wavelet packet transform to obtain the fault features using different wavelet basis function, and the wavelet basis function with maximum
doi:10.2991/eame-17.2017.1
fatcat:fdyvndd3ored3nfshpgqmt3hqa