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We present an X-band ferromagnetic resonance (FMR) study of polycrystalline single Ni films and of two Ni layers separated by an Ag layer at room temperature. Films were deposited by sputtering on glass using Ag over-and underlays. The single Ni films have a FMR mode with a dependence of the resonance field on the angle a between the magnetic field and the plane in good agreement with theory. In samples with two Ni films coupled through an intervenient Ag layer, only one FMR mode is observed ifdoi:10.1063/1.352642 fatcat:pxpobles3jaw7buggdxp2k2wgi