ABF STEM Characterization of Light Elements in Ceramic Interface

Y Ikuhara, R Huang, S Findlay, T Mizoguchi, N Shibata, T Hirayama
2011 Microscopy and Microanalysis  
Grain boundaries (GB) of crystals have peculiar electronic structures, caused by the disorder in periodicity, providing the functional properties, which cannot be observed in a perfect crystal. Ceramic materials are composed of light elements, and light elements in the GB structural units play a crucial role in the material properties. Recently we have reported that annular bright field (ABF) STEM imaging is very powerful technique to produce images showing both light and heavy element columns
more » ... vy element columns simultaneously [1] . In this technique, an annular detector is located within the bright-field (direct-scattered) region, and the columns display absorptive-type contrast. Importantly, ABF image contrast does not change remarkably over a wide thickness range, which gives a simple and reliable image interpretation. This method thus represents a less time-consuming technique for reliably identifying the presence and positions of light elements. In this study, GB atomic structures including light elements in several ceramics are directly observed by ABF STEM. STEM observations were performed on a Cs-corrected JEM-2100F equipped with Gatan Image Filter (GIF).
doi:10.1017/s1431927611007549 fatcat:5e6msly4mjgyha2s2ww6zegaoe