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Optoelectronic Imaging and Multimedia Technology V
A preliminary study of a non-reference aliasing artefact index (AAI) metric is presented in this paper. We focus on the effects of combining a full-reference metric and interpolation algorithm. The nearest neighbor algorithm (NN) is used as the gold standard against which test-algorithms are judged in terms of aliased structures. The structural similarity index (SSIM) metric is used to evaluate a test image (i.e. a test-algorithm's image) and a reference image (i.e. the NN's image). Preliminarydoi:10.1117/12.2503872 fatcat:snhtu5f36fcw7p55ehumfutlqq