Effects of a slow harmonic displacement on an Atomic Force Microscope system under Lennard-Jones forces

Morad Khadraoui, Faouzi Lakrad, Mohamed Belhaq, M. Belhaq
2016 MATEC Web of Conferences  
We focus in this paper on the modeling and dynamical analysis of a tapping mode atomic force microscopy (AFM). The microbeam is subjected to a low frequency harmonic displacement of its base and to the Lennard-Jones (LJ) forces at its free end. Static and modal analysis are performed for various gaps between the tip of the microbeam and a sample. The Galerkin method is employed to reduce the equations of motion to a fast-slow dynamical system. We show that the dynamics of the AFM system is
more » ... AFM system is governed by the contact and the noncontact invariant slow manifolds. The tapping mode is triggered via two saddle-node bifurcations of these manifolds. Moreover, the contact time is computed and the effects of the base motion amplitude and the initial gap are discussed. matecconf/201 MATEC Web of Conferences 4 7 7 , 83 CSNDD 2016 68304001
doi:10.1051/matecconf/20168304001 fatcat:2bs7dchkrjdhtd7aovgdyzx5sm