Dual-edge late-transition detector for testing the metastability effect in flip-flops

J. Kalisz, Z. Jachna
Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004.  
ln( 2 1 2 1 LH LH LH r LH r LH M M t t -= t LH c d t LH
doi:10.1109/icm.2004.1434782 fatcat:jry2z5eifnfdpenkndczyftkhq