Micromachined III V cantilevers for AFM-tracking scanning Hall probe microscopy

A J Brook, S J Bending, J Pinto, A Oral, D Ritchie, H Beere, A Springthorpe, M Henini
2002 Journal of Micromechanics and Microengineering  
doi:10.1088/0960-1317/13/1/317 fatcat:rlvmeo4yprejrf4zguwfcfbnxa