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Two modeling approaches for the estimation of durum wheat yield based on Sentinel-2 data are presented for 66 fields across three growing periods. In the first approach, a previously developed multiple linear regression model (VI-MLR) based on vegetation indices (EVI, NMDI) was used. In the second approach, the reflectance data of all Sentinel-2 bands for several dates during the growth periods were used as input parameters in three machine learning model algorithms, i.e., random forest (RF),doi:10.3390/rs14163880 fatcat:45s6zevx3faq3gy37bc7qiid3y