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Pattern recognition is an important analytical tool in electrofacies analysis. In this paper, we study several commonly used clustering and classification algorithms. On the basis of advantages and disadvantages of existing algorithms, we introduce the KMRIC algorithm, which improves initial centers ofK-means. Also, we propose the AKM algorithm which automatically determines the number of clusters and apply support vector machine to classification. Finally, we apply these algorithms todoi:10.1155/2014/640406 fatcat:gr6vmgdoaze4tbjwtnoqd4lima