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We consider an inverse problem arising from an time-dependent drift-diffusion model in semiconductor devices, which is formulated in terms of a system of parabolic equations for the electron and hole densities and the Poisson equation for the electric potential. This inverse problem aims to identify the doping profile from the final overdetermination data of the electric potential. By using the Schauder's fixed point theorem in suitable Sobolev space, the existence of this inverse problem aredoi:10.2478/auom-2014-0045 fatcat:zmv6cil2xbajzi6tzesvr4cd4i