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Snow microstructure is an important factor for microwave and optical remote sensing of snow. One parameter used to describe it is the specific surface area (SSA), which is defined as the surface-area-to-mass ratio of snow grains. Reflectance at near infrared (NIR) and short-wave infrared (SWIR) wavelengths is sensitive to grain size and therefore also to SSA through the theoretical relationship between SSA and optical equivalent grain size. To observe SSA, the IceCube measures the hemisphericaldoi:10.3390/geosciences8110404 fatcat:txqjoyfl6nfsbpi7rjc32rpkg4