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DEPTH CONTROLLED EXAFS AND NEAR EDGE SPECTROSCOPY TO STUDY SURFACE LAYER STRUCTURE
1986
Le Journal de Physique Colloques
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Calculated and experimental intensity values are presented and compared for EXAFS spectrometry at grazing incidence with fluorescence or reflectivity detection, and samples in the form of single or double metal films evaporated onto flat glass substrates. The limited and controllable penetration of X-rays incident at grazing angles onto flat samples provides scope for the investigation of surface regions. An EXAFS and near-edge X-ray spectrometer with How then can the depth effect be checked?
doi:10.1051/jphyscol:19868171
fatcat:j24win7mcbbaflvwgjbwfocpna