Invitation of Electron-Acoustic Microscopy and its Application to Observation of Dislocation Lines
電子線超音波顕微鏡の基礎と転位線観察への応用

Hiroshi Takenoshita
1992 Denshi kenbikyo  
doi:10.11410/kenbikyo1950.27.111 fatcat:n2x7jn2b45gurexanivbj2nbma