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A New Epstein Frame for Lamination Core Loss Measurements at High Frequencies and Flux Densities
2005
IEEE International Conference on Electric Machines and Drives, 2005.
This paper presents a new Epstein frame optimized for high frequencies and high flux densities. The design philosophy and test results at high power frequencies are presented. The frame achieves high frequency and high flux density performance because of reduced number of turns and reduced number of samples, while using standard 25-cm Epstein samples. For the current application, only the 0.0140-inch (0.36 mm) M45 was used. Measured results obtained show good agreement with the core loss data
doi:10.1109/iemdc.2005.195784
fatcat:dpxvaotqprc4rmboeactasqcly