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We have investigated native Bombyx mori cocoon silk and regenerated thin films using a relatively new technique, low voltage transmission electron microscopy (LVTEM) , with the goal of improving understanding of silk processing-structure relationships. Using accelerating voltages of approximately 5 kV, the LVTEM generates extremely high contrast for small changes in sample density or thickness. We have also used various microscopy and diffraction techniques to characterize recombinant silkdoi:10.1017/s1431927605505622 fatcat:dddljlieyzemzlhakbiriuuxcm