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Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films
2010
Journal of the Vacuum Society of Japan
Recent progresses of the terahertz time-domain spectroscopy are reviewed in view of broadening the detection bandwidth that can be measured. Using an ultra-short pulsed laser with the pulse duration of 15 fs and photo-conducting antennas in the re‰ection geometry, we can realize useful broadband terahertz spectrometers that are capable of measuring real and imaginary parts of the dielectric constants in materials over a wide frequency range. The detection bandwidth expands up to 20 THz with the
doi:10.3131/jvsj2.53.301
fatcat:7n723yxx7rgzrnkwphiopdqia4