Time‐resolved doubly bent crystal x‐ray spectrometer

M. P. Hockaday, M. D. Wilke, R. L. Blake, J. Vaninetti, N. T. Gray, P. T. Nedrow
1988 Review of Scientific Instruments  
X-ray spectroscopy is an essential tool in high temperature plasma research. We describe a time-resolved x-ray spectrometer suitable for measuring spectra in harsh environments common to many very high energy density laboratory plasma sources. The spectrometer consisted of a doubly curved Si(l 11) crysta! ciiffrection element, a WL-1 201 (ZnO:Ga) phosphor, a c~herent fiber optic array, and two visible streak cameras. The spectrometer design described here has a minimum time resolution of 1,3 ns
more » ... esolution of 1,3 ns with 2.8 eV spectral resolution over a 200 eV wide bandpass in the 6-7 keV region of the spectrum. Complete system soectral throughput calibrations were done at the Cornell High Emwgy Synchro!ron (CHESS), Details of the design and calibration rer,ults are preccmted, * Work performed under the auspic~s of USDOE.
doi:10.1063/1.1140071 fatcat:2raoxbxif5dfraywxw3r44ccae