Two-level compression through selective reseeding

P. Wohl, J.A. Waicukauski, F. Neuveux, G.A. Maston, N. Achouri, J.E. Colburn
2013 2013 IEEE International Test Conference (ITC)  
As scan compression becomes ubiquitous, ever more complex designs require higher compression. This paper presents a novel, two-level compression system for scan input data generated by deterministic test generation. First, load care bits and X-control input data are encoded into PRPG seeds; next, seeds are selectively shared for further compression. The latter exploits the hierarchical nature of large designs with tens or hundreds of PRPGs. The system comprises a new architecture, which
more » ... ture, which includes a simple instruction-decode unit, and new algorithms embedded into ATPG. Results on large industrial designs demonstrate significant data and cycle compression increases while maintaining test coverage and performance.
doi:10.1109/test.2013.6651896 dblp:conf/itc/WohlWNMAC13 fatcat:u5drdvldanaktfqsqoc2kaggkq