Automated debugging from pre-silicon to post-silicon

Mehdi Dehbashi, Gorschwin Fey
2012 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)  
Due to the increasing design size and complexity of modern Integrated Circuits (IC) and the decreasing time-tomarket, debugging is one of the major bottlenecks in the IC development cycle. This paper presents a generalized approach to automate debugging which can be used in different scenarios from design debugging to post-silicon debugging. The approach is based on model-based diagnosis. Diagnostic traces are proposed as an enhancement reducing debugging time and increasing diagnosis accuracy.
more » ... The experimental results show the effectiveness of the approach in post-silicon debugging.
doi:10.1109/ddecs.2012.6219082 dblp:conf/ddecs/DehbashiF12 fatcat:q4xqraylffdanhhqdfh3dgm2q4