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Segmentation plays an important role in the pattern recognition and image processing areas. Several techniques have been proposed aiming at solving generic issues or particular applications. Traditionally, these techniques have been evaluated by using the Overlap measure, which verifies the coincident and non-coincident areas between the image resulting from a segmentation process and an image considered correct. Albeit widely, this type of measure does not allow flexibility in the assessmentdoi:10.1186/s13173-016-0050-7 fatcat:eghpykfbh5gbfp5iy7n77jqvx4