A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories

C. Zambelli, M. Indaco, M. Fabiano, S. Di Carlo, P. Prinetto, P. Olivo, D. Bertozzi
2012 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)  
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories / Zambelli C.; Indaco M.; Fabiano M.; Di Carlo S.; Prinetto P.; Olivo P.; Bertozzi D.
doi:10.1109/date.2012.6176622 dblp:conf/date/ZambelliIFCPOB12 fatcat:j4olx4p3wjbotbi4itcypx5tki