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We present some advanced characterization techniques developed to investigate on the opto-electronic properties of thin film semiconductors and apply them to perovskite layers. These techniques are the steady state photocarrier grating (SSPG) and the Fourier transform photocurrent spectroscopy (FTPS). The SSPG was developed to study the ambipolar diffusion length of carriers and the FTPS was imagined to measure the variations of the below gap absorption coefficient with the light energy, givingdoi:10.1051/epjpv/2019009 fatcat:hccvbjzq65el5az2xg5tbnlkca