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The Bunch Arrival-Time Monitor for SwissFEL (BAM) is based on the concept, which was successfully tested at the SwissFEL Test Facility . During the gap between the SITF decommissioning and the start of SwissFEL, all key components underwent design improvement. In this paper, we report on these new developments, including the mechanical design of the BAM-Pickup and RF-front end, the electro-optical front end (BAM-Box), the data acquisition front end, the new expert- and user applications. Wedoi:10.18429/jacow-ibic2017-tupcc15 fatcat:w4jjhyk25jb2dmqnwaxhklii2u