Quantification of Grain Boundary Segregation Monolayers by X-ray Spectroscopy in a Scanning Electron Microscope

P Nowakowski, F Christien, M Allart, Y Borjon-Piron, R Le Gall, J Ménard, H Mantz
2011 Microscopy and Microanalysis  
doi:10.1017/s1431927611003886 fatcat:jwhqips6grg3njf2kbqmji3fw4