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To verify the reliability of a typical Pb-free circuit board applied for space exploration, five circuits were put into low temperature and shock test. However, after the test, memories on all five circuits were out of function. To investigate the cause of the failure, a series of methods for failure analysis was carried out, including X-ray detection, cross-section analysis, Scanning Electron Microscope (SEM) analysis, and contrast test. Through failure analysis, the failure was located in thedoi:10.3390/app10061951 fatcat:gisylcv6t5cz7ihsuyfsh7gmfi