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Nanostructured SnO2 thin films were prepared by spraying tin chloride dihydrate onto the heated glass substrate at 250°C. The films were fired at 500°C. As-prepared thin films were studied using XRD and FESEM to know crystal structure and surface morphology. The average crystallite and grain size observed from XRD and FF-SEM was found to be less than 33 and 67 nm, respectively. The films sprayed for 30 min were observed to be most sensitive to H2S at 250°C. The results are discussed and interpreted.doi:10.5402/2012/734325 fatcat:22xdpra765bjbejzhwbaijo5em