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Mitigation of electron-beam damage of methylammonium lead iodide (MAPbI<sub>3</sub>) using a modified laser-driven pulsed-beam TEM is demonstrated. For the same dose rates and total doses, it is shown that using a pulsed electron beam causes less damage to MAPbI<sub>3</sub> than a conventional thermionic (random) beam. Varying electron-pulse size (<i>i.e.</i>, number of electrons per pulse) and the time between pulses is also studied. It is found that damage increases with increasing pulse sizedoi:10.26434/chemrxiv.12756461.v1 fatcat:smpohcdhzndzhaxd63otikbsv4